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Failure Analysis Equipment

Acid and Mechancial Sample Preparation, Emission Microscope and Curve Tracer

     
 
     
 

NISENE Technology IC Package Acid Decapsulators - JET ETCH
ULTRATEC Mechanical Stacked Die Decapsulation and Wafer Thinning for Backside Emmission
 
 
 
 
 
  NISENE Technology Die Layer Deprocessing - OMNI ETCH    
 
   
 
 
 
U-TECH Photon Emission, Liquid Crytsal Analysis, Fluorescent Emission, Probe Station and Accessories
CHIRON Technology Automatic Curve Tracer
     
         
 
 

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