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Semicon Shanghai Exhibition 2005
DATE:
Date: 15-17 Mar 2005
BOOTH:
Hall 4, Booth 4725
VENUE:
Shanghai New International Expo Centre (SNIEC) Shanghai, China
See Venue Locator Map. located at 2345 Longyang Road Shanghai 201204, PR China
EXHIBITS:

FEINFOCUS X-Ray Inspection System - COUGAR FXS 160.16
SONOSCAN Acoustic Microscope - D9000
NISENE Technology Decapulation - Jet-Etch Package Decap Omni-etch Die Level Deprocessing
TET Electrostatic Test Solutions - ESD Event Detector, ECDM 400E, EV10A, Bench-Top Simulator
DYNALYST Loadboard
KULICKE and SOFFA - Gold, Aluminium Wires and Capillary

 
Nepcon Shanghai Exhibition 2005
     
DATE:
Date: 12-15 Apr 2005
BOOTH:
2M08
VENUE:
Shanghai Everbright Convention & Exhibition Centre. Shanghai, China
See Venue Locator Map. located at 66 Caobao Road, Shanghai 200233, P.R.China.
EXHIBITS:

FEINFOCUS X-Ray Inspection System - COUGAR FXS 160.16
SONOSCAN Acoustic Microscope - D9000
NISENE Technology Decapulation - Jet-Etch Package Decap Omni-etch Die Level Deprocessing
KULICKE and SOFFA - Gold, Aluminium Wires and Capillary

 
Nepcon Shenzhen Exhibition 2005
     
DATE:
Date: 30 Aug -02 Sep 2005
BOOTH:
To be confirmed
VENUE:
Shenzhen New Convention & Exhibition Centre, China
EXHIBITS:

FEINFOCUS X-Ray Inspection System - COUGAR FXS 160.16
SONOSCAN Acoustic Microscope - D9000
NISENE Technology Decapulation - Jet-Etch Package Decap Omni-etch Die Level Deprocessing
KULICKE and SOFFA - Gold, Aluminium Wires and Capillary

 
   
 
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